Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures
نویسندگان
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملScanning near-field optical microscopy.
An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and...
متن کاملNear-field scanning optical microscopy of photonic crystal nanocavities
Near-field scanning optical microscopy was used to observe high-resolution images of confined modes and photonic bands of planar photonic crystal ~PPC! nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes, which are intentionally produced by fractional edge dislocation high-Q cavity designs. The size of the detected mode was roughly four by thre...
متن کاملNear-field Scanning Optical Microscopy of Photonic Crystal Laser
Near-field scanning optical microscopy (NSOM) is a powerful alternative method to observe the optical intensity distributions in fabricated nanophotonic structures. Several groups have obtained NSOM images of photonic crystal (PC) [1-2]. Quite recently, we have reported the optical mode images obtained by NSOM on compact PC cavities based on fractional edge dislocations [3]. Here we report high...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2013
ISSN: 1094-4087
DOI: 10.1364/oe.21.016629